Effects of macroscopic inhomogeneities on resistive and Hall measurements on crosses, cloverleafs, and bars

Review of Scientific Instruments

Volumn 67, Issue 12, 1996, Pages 4282-4285

  Koon, D W ^a   Knickerbocker, C J ^a  

^a ST LAWRENCE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039500942     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147527     Document Type: Article

References (4)

1. C. M. Wolfe and G. E. Stillman, in Semiconductors and Semimetals, edited by R. K. Willardson and A. C. Beer (Academic, New York, 1975), Vol. 10, p. 175.
2. D. W. Koon and C. J. Knickerbocker, Rev. Sci. Instrum. 63, 207 (1992).
3. D. W. Koon and C. J. Knickerbocker, Rev. Sci. Instrum. 64, 510 (1993).
4. L. J. van der Pauw, Phillips Res. Rep. 13, 1 (1958).