Recent ORNL measurements of chemical sputtering of ATJ graphite by slow atomic and molecular D ions

Physica Scripta T

Volumn T124, Issue , 2006, Pages 44-49

  Meyer, F W ^a   Vergara, L I ^a   Krause, H F ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MASS SPECTROMETRY; MOLECULAR DYNAMICS; SCATTERING; SPUTTERING;

CHEMICAL SPUTTERING; QUADRUPOLE MASS SPECTROMETER (QMS);

GRAPHITE;

EID: 33749326294     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1088/0031-8949/2006/T124/009     Document Type: Article

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