Guided visibility sampling

ACM Transactions on Graphics

Volumn 25, Issue 3, 2006, Pages 494-502

  Wonka, Peter ^a   Wimmer, Michael ^b   Zhou, Kaichi ^a   Maierhofer, Stefan ^c   Hesina, Gerd ^c   Reshetov, Alexander ^d  

^a ARIZONA STATE UNIVERSITY   (United States)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^c VRVIS RESEARCH CENTER   (Austria)

^d INTEL CORPORATION   (United States)

Author keywords

Occlusion culling; PVS; Visibility; Visibility sampling

Indexed keywords

OCCLUSION CULLING; SAMPLING EFFICIENCY; STOCHASTIC RAY; VISIBILITY SAMPLING;

ALGORITHMS; COMPUTATION THEORY; PROBLEM SOLVING; RAY TRACING; STOCHASTIC CONTROL SYSTEMS;

VISIBILITY;

EID: 33749236973     PISSN: 07300301     EISSN: 07300301     Source Type: Conference Proceeding    
DOI: 10.1145/1141911.1141914     Document Type: Conference Paper

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