Surface structures of scandium silicides grown on Si(1 1 1) studied by STM, AFM and electron diffraction

Surface Science

Volumn 600, Issue 18, 2006, Pages 4126-4131

  Norenberg C ^a,b   Moram, M A ^c   Dobson, P J ^b  

^a SWANSEA UNIVERSITY   (United Kingdom)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Atomic force microscopy; Epitaxy; Morphology; Reflection high energy electron diffraction (RHEED); Roughness and topography; Scandium; Scanning tunneling microscopy; Silicides; Surface structure

Indexed keywords

ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; HIGH ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SURFACE ROUGHNESS; SURFACE STRUCTURE;

FLAT TERRACES; ROD SHAPED ISLANDS; SILICIDES;

SCANDIUM COMPOUNDS;

EID: 33749131902     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.01.132     Document Type: Article

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