메뉴 건너뛰기




Volumn 482-485, Issue PART 2, 2001, Pages 1337-1342

Surface morphology of yttrium silicides epitaxially grown on Si(1 1 1) by STM

Author keywords

Epitaxy; Scanning tunneling microscopy; Silicides; Surface defects; Surface structure, morphology, roughness, and topography; Yttrium

Indexed keywords


EID: 0000616934     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)00923-2     Document Type: Article
Times cited : (20)

References (22)
  • 20
    • 22244480851 scopus 로고    scopus 로고
    • in preparation
    • C. Polop, et al., in preparation.
    • Polop, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.