Low-parasitic ESD protection strategy for RF ICs in 0.35μm CMOS process

Chinese Physics

Volumn 15, Issue 10, 2006, Pages 2297-2305

  Wang, Yuan ^a   Jia, Song ^a   Chen, Zhong Jian ^a   Ji, Li Jiu ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

Electrostatic discharge; Leakage current; Parasitic capacitance; Radio frequency

Indexed keywords

CAPACITANCE; ELECTRIC DISCHARGES; ELECTROSTATICS; HUMAN FORM MODELS; LEAKAGE CURRENTS;

NONADIABATIC COUPLING; PARASITIC CAPACITANCE; RADIO FREQUENCY;

CMOS INTEGRATED CIRCUITS;

EID: 33749033898     PISSN: 10091963     EISSN: 17414199     Source Type: Journal    
DOI: 10.1088/1009-1963/15/10/018     Document Type: Article

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