Fundamental spatial resolution of an x-ray pore optic

Applied Optics

Volumn 44, Issue 33, 2005, Pages 7098-7105

  Mieremet, Arjan L ^a   Beijersbergen, Marco W ^a  

^a Cosine Science and Computing BV ^*  (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL RESOLVING POWER; OPTICAL TELESCOPES; SPECTROSCOPIC ANALYSIS; X RAY DIFFRACTION;

DIFFRACTION INTEGRALS; SPATIAL RESOLUTION; X RAY PORE OPTICS;

X RAY OPTICS;

EID: 29144534517     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.007098     Document Type: Article

References (9)

1. A. N. Parmar, M. Arnaud, X. Barcons, J. Bleeker, G. Hasinger, H. Inoue, G. Palumbo, and M. Turner, "Science with XEUS: the X-ray Evolving Universe Spectroscopy Mission," in UV and Gamma-Ray Space Telescope Systems, G. Hasinger and M. J. Turner, eds., Proc. SPIE 5488, 388-393 (2004).
2. M. Bavdaz, D. Lumb, and A. Peacock, "XEUS mission reference design," in UV and Gamma-Ray Space Telescope Systems, G. Hasinger and M. J. Turner, eds., Proc. SPIE 5488, 829-836 (2004).
3. M. Beijersbergen, M. Bavdaz, A. Peacock, E. Tomaselli, R. Fairbend, J.-P. Boutot, S. Flyckt, A. Brunton, G. Price, G. Fraser, C. Herrmann, M. Krumrey, E. Ziegler, and A. Freund, "High-resolution micropore x-ray optics produced with microchannel plate technology," in Advances in X-Ray Optics, A. Freund, T. Ishikawa, A. Khounsary, D. Mancini, A. Michette, and S. Oestreich, eds., Proc. SPIE 4145, 188-192 (2001).
4. M. Beijersbergen, S. Kraft, R. Guenther, A. Mieremet, M. Collon, M. Bavdaz, D. Lumb, and A. Peacock, "Silicon pore optics: novel lightweight high-resolution X-ray optics developed for XEUS," in UV and Gamma-Ray Space Telescope Systems, G. Hasinger and M. J. Turner, eds., Proc. SPIE 5488, 868-874 (2004).
5. H. Wolter, "Spiegelsysteme streifenden Einfalls als abbildende Optiken für Röntgenstrahlen," Ann. Phys. 10, 94-114 (1952).
6. M. Born and E. Wolf, Principles of Optics (Cambridge U. Press, 1999), pp. 412-516.
7. F. Pedrotti and L. Pedrotti, Introduction to Optics (Prentice-Hall, 1987), pp. 323-348.
8. 9 into [cos(2z)-1]/(2z) + Si(2z) = π/4, where Si is the sine-integral function, giving z = 0.850. This solution has to be divided by π to yield the relative position of the HEW with respect to the first zero points of the central peak of the diffraction pattern.
9. I. S. Gradsteyn and I. M. Ryzhik, Table of Integrals, Series and Products, 6th ed. (Academic, 2000).