Hole-transporting interlayers for improving the device lifetime in the polymer light-emitting diodes

Applied Physics Letters

Volumn 89, Issue 12, 2006, Pages

  Lee, Tae Woo ^a   Kim, Mu Gyeom ^a   Kim, Sang Yeol ^a   Park, Sang Hun ^a   Kwon, Ohyun ^a   Non, Taeyong ^a   Oh, Tae Sik ^b  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^b SunMoon University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; HEAT TREATMENT; HOLE MOBILITY; OPTICAL DEVICES; POLYMERS; THERMAL EFFECTS;

ELECTRON-HOLE BALANCE; EMITTING LAYER (EML); HOLE CURRENT;

LIGHT EMITTING DIODES;

EID: 33748970892     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2345239     Document Type: Article

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