A critical assessment of dislocation multiplication laws in germanium

Acta Materialia

Volumn 54, Issue 18, 2006, Pages 4721-4729

  Kruml, T ^a   Dupas, C ^b   Martin, J L ^b  

^a INSTITUTE OF PHYSICS OF MATERIALS   (Czech Republic)

^b EPFL   (Switzerland)

Author keywords

Creep tests; Dislocation multiplication; Elemental semiconductors; Stress relaxation tests

Indexed keywords

COMPUTER SIMULATION; CREEP TESTING; DISLOCATIONS (CRYSTALS); PLASTICITY; SINGLE CRYSTALS; STRESS ANALYSIS; STRESS RELAXATION;

DISLOCATION MULTIPLICATION; ELEMENTAL SEMICONDUCTORS; STRESS RELAXATION TESTS; TRANSIENT TEST CURVES;

SEMICONDUCTING GERMANIUM;

EID: 33748961862     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2006.06.012     Document Type: Article

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