Dislocation multiplication, exhaustion and mechanical behaviour for Ge single crystals

Journal of Physics Condensed Matter

Volumn 14, Issue 48, 2002, Pages 12989-12995

  Dupas, Corinne ^a   Zuodar, Nadia ^a   Coddet, Olivier ^a   Kruml, Tomas ^a   Martin, Jean Luc ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CREEP TESTING; DISLOCATIONS (CRYSTALS); SEMICONDUCTING GERMANIUM; STRESS RELAXATION; TRANSMISSION ELECTRON MICROSCOPY;

DISLOCATION MULTIPLICATION; ETCH PIT TECHNIQUE; STRAIN LOCALIZATION; STRESS DIP TESTS;

SINGLE CRYSTALS;

EID: 0037122177     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/14/48/342     Document Type: Article

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