SCOPUS 정보 검색 플랫폼

Volumn 322, Issue 1-2, 2002, Pages 118-125

Characterization of thermally activated dislocation mechanisms using transient tests

Author keywords

Activation volume; Dislocation exhaustion; Mobile dislocations densities; Transient tests

Indexed keywords

CREEP; DISLOCATIONS (CRYSTALS); PLASTIC DEFORMATION; STRESS ANALYSIS; THERMAL CONDUCTIVITY;

TRANSIENT TESTS;

MATERIALS SCIENCE;

STRESS-STRAIN ANALYSIS;

EID: 0037081607 PISSN: 09215093 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5093(01)01124-8 Document Type: Article

Times cited : (49)

References (20)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.