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Volumn 600, Issue 18, 2006, Pages 4280-4284

Influence of the tip of the scanning tunneling microscope on surface electron lifetimes

Author keywords

Electric field; Lifetimes; Many body; STM; Surface states

Indexed keywords

ELECTRIC FIELDS; SCANNING TUNNELING MICROSCOPY; SCATTERING;

EID: 33748951158     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.11.071     Document Type: Article
Times cited : (6)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.