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Volumn 600, Issue 18, 2006, Pages 4280-4284
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Influence of the tip of the scanning tunneling microscope on surface electron lifetimes
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Author keywords
Electric field; Lifetimes; Many body; STM; Surface states
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Indexed keywords
ELECTRIC FIELDS;
SCANNING TUNNELING MICROSCOPY;
SCATTERING;
IMAGE STATE ELECTRONS;
INELASTIC SCATTERING;
SURFACE STATES;
ELECTRONS;
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EID: 33748951158
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2005.11.071 Document Type: Article |
Times cited : (6)
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References (21)
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