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Volumn 82, Issue 22, 1999, Pages 4516-4519
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Probing hot-electron dynamics at surfaces with a cold scanning tunneling microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001370450
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.82.4516 Document Type: Article |
Times cited : (198)
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References (24)
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