Surface-State Lifetime Measured by Scanning Tunneling Spectroscopy

Physical Review Letters

Volumn 81, Issue 20, 1998, Pages 4464-4467

  Li, Jiutao ^a,d   Schneider, Wolf Dieter ^a   Berndt, Richard ^b   Bryant, O R ^c   Crampin, S ^c  

^a UNIVERSITY OF LAUSANNE   (Switzerland)

^b RWTH AACHEN UNIVERSITY   (Germany)

^c University of Bath   (United Kingdom)

^d University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIATION (CALCULUS); ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRON TUNNELING; GREEN'S FUNCTION; LOW TEMPERATURE OPERATIONS; MATHEMATICAL MODELS; PHOTOEMISSION; SCANNING TUNNELING MICROSCOPY; SURFACE MEASUREMENT;

QUASIPARTICLE INTERACTIONS; SHOCKLEY SURFACE STATES; SURFACE STATE LIFETIME;

QUANTUM THEORY;

EID: 0032538721     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.81.4464     Document Type: Article

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