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Volumn 86, Issue 33-35 SPEC. ISSUE, 2006, Pages 5505-5519
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On the analysis of the stress-strain behaviour of thin metal films on substrates using nanoindentation
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Author keywords
[No Author keywords available]
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Indexed keywords
INDENTATION;
NEURAL NETWORKS;
STIFFNESS;
STRESS ANALYSIS;
SUBSTRATES;
THIN FILMS;
FILM THICKNESS;
FOCUSED ION BEAM MICROSCOPY;
STRESS-STRAIN CURVES;
SUBSTRATE HARDNESS;
METALLIC FILMS;
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EID: 33748760061
PISSN: 14786435
EISSN: 14786443
Source Type: Journal
DOI: 10.1080/14786430600615033 Document Type: Conference Paper |
Times cited : (5)
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References (24)
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