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1
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29044450067
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Resolution enhancement of 157 nm lithography by liquid immersion
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M. Switkes and M. Rothschild, "Resolution enhancement of 157 nm lithography by liquid immersion," J. Microlithogr., Microfabr., Microsyst. 1(3), 225-228 (2002).
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(2002)
J. Microlithogr., Microfabr., Microsyst.
, vol.1
, Issue.3
, pp. 225-228
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Switkes, M.1
Rothschild, M.2
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2
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84888911099
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Characterization and meaningful quantification of resist component leaching into immersion fluid
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Vancouver, BC
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S. Robertson, J. Leonard, J. Alexander, F. Huby, and K. Willey, "Characterization and meaningful quantification of resist component leaching into immersion fluid," presented at the Immersion and 157 nm Lithography Symposium, Vancouver, BC (2004).
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(2004)
Immersion and 157 Nm Lithography Symposium
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Robertson, S.1
Leonard, J.2
Alexander, J.3
Huby, F.4
Willey, K.5
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3
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33748566050
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Liquid immersion lithography for 193 nm: Resist-liquid interactions status and update
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July 11, Almaden, CA, IBM
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W. Hinsberg, G. Wallraff, C. Larson, B. Davis, V. Deline, S. Raoux, D. Miller, F. Houle, J. Hoffnagle, L. Sundberg, R. Dammel, and W. Conley, "Liquid immersion lithography for 193 nm: Resist-liquid interactions status and update," presented at the 2nd Immersion Lithography Workshop, July 11, 2003, Almaden, CA, IBM.
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(2003)
2nd Immersion Lithography Workshop
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Hinsberg, W.1
Wallraff, G.2
Larson, C.3
Davis, B.4
Deline, V.5
Raoux, S.6
Miller, D.7
Houle, F.8
Hoffnagle, J.9
Sundberg, L.10
Dammel, R.11
Conley, W.12
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4
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3142579490
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Understanding interfacial diffusion of ionic species in 193 immersion lithography using scanning electrochemical microscopy
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Jan. 27, Los Angeles, CA
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R. J. LeSuer, F. F. Fan, and A. J. Bard, "Understanding interfacial diffusion of ionic species in 193 immersion lithography using scanning electrochemical microscopy," presented at the 3rd Immersion Workshop, Jan. 27, 2004, Los Angeles, CA.
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(2004)
3rd Immersion Workshop
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Lesuer, R.J.1
Fan, F.F.2
Bard, A.J.3
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5
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3142580092
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Photoresist component extraction measurements using radiochemical analysis
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Jan. 27, Los Angeles, CA
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C. Taylor, "Photoresist component extraction measurements using radiochemical analysis," presented at the 3rd Immersion Workshop, Jan. 27, 2004, Los Angeles, CA.
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(2004)
3rd Immersion Workshop
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Taylor, C.1
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6
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25144478804
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Controlled contamination studies in 193-nm immersion lithography
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V. Liberman, S. T. Palmacci, D. E. Hardy, M. Rothschild, and A. Grenville, "Controlled contamination studies in 193-nm immersion lithography," Opt. Microlith., pp. 148-153 (2005).
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(2005)
Opt. Microlith.
, pp. 148-153
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Liberman, V.1
Palmacci, S.T.2
Hardy, D.E.3
Rothschild, M.4
Grenville, A.5
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7
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0004185393
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Prentice Hall, Upper Saddle River, NJ
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A. F. Mills, Mass Transfer, Prentice Hall, Upper Saddle River, NJ (2001).
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(2001)
Mass Transfer
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Mills, A.F.1
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8
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0040707402
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Outgassing of organic vapors from 193-nm photoresists: Impact on atmospheric purity near the lens optics
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R. R. Kunz and D. K. Downs, "Outgassing of organic vapors from 193-nm photoresists: Impact on atmospheric purity near the lens optics," J. Vac. Sci. Technol. B 17(6), 3330-3334 (1999).
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(1999)
J. Vac. Sci. Technol. B
, vol.17
, Issue.6
, pp. 3330-3334
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Kunz, R.R.1
Downs, D.K.2
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9
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0034187907
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Experimentation and modeling of organic photocontamination on lithographic optics
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R. R. Kunz, V. Liberman, and D. K. Downs, "Experimentation and modeling of organic photocontamination on lithographic optics," J. Vac. Sci. Technol. B 18(3), 1306-1313 (2000).
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(2000)
J. Vac. Sci. Technol. B
, vol.18
, Issue.3
, pp. 1306-1313
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Kunz, R.R.1
Liberman, V.2
Downs, D.K.3
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10
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0033269286
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Outlook for 157 nm resist design
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R. R. Kunz, T. M. Bloomstein, D. E. Hardy, R. B. Goodman, D. K. Downs, and J. E. Curtin, "Outlook for 157 nm resist design," J. Vac. Sci. Technol. B 17(6), 3267-3272 (1999).
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(1999)
J. Vac. Sci. Technol. B
, vol.17
, Issue.6
, pp. 3267-3272
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Kunz, R.R.1
Bloomstein, T.M.2
Hardy, D.E.3
Goodman, R.B.4
Downs, D.K.5
Curtin, J.E.6
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11
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13244286974
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Modeling fluid thermomechanical response for immersion lithography scanning
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A. Wei, A. Abdo, G. Nellis, R. L. Engelstad, J. Chang, E. G. Lovell, and W. Beckman, "Modeling fluid thermomechanical response for immersion lithography scanning," Microelectron. Eng. 73, 74, 29-34 (2004).
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(2004)
Microelectron. Eng.
, vol.73-74
, pp. 29-34
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Wei, A.1
Abdo, A.2
Nellis, G.3
Engelstad, R.L.4
Chang, J.5
Lovell, E.G.6
Beckman, W.7
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