Thermochromism of sputter deposited WxV1-xO2 films

Solar Energy Materials and Solar Cells

Volumn 44, Issue 4, 1996, Pages 451-455

  Sobhan, M A ^b   Kivaisi, R T ^c   Stjerna, B ^d   Granqvist, C G ^a  

^a UPPSALA UNIVERSITY   (Sweden)

^b UNIVERSITY OF RAJSHAHI   (Bangladesh)

^c UNIVERSITY OF DAR ES SALAAM   (Tanzania)

^d NONE   (Sweden)

Author keywords

Rutherford backscattering spectrometry; Sputtering; X ray diffraction

Indexed keywords

CHEMICAL ANALYSIS; COMPOSITION EFFECTS; INFRARED TRANSMISSION; MAGNETRON SPUTTERING; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPUTTER DEPOSITION; TUNGSTEN COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

THERMOCHROMIC SWITCHING TEMPERATURE; TUNGSTEN VANADIUM OXIDES;

THIN FILMS;

EID: 0030393123     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(95)00051-8     Document Type: Article

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