Hysteresis of the metal-insulator transition of VO2; evidence of the influence of microscopic texturation

Journal of Physics Condensed Matter

Volumn 11, Issue 16, 1999, Pages 3259-3264

  Petit, Christophe ^a   Frigerio, Jean Marc ^a   Goldmann, Michel ^b,c  

^a CNRS   (France)

^b INSTITUT CURIE   (France)

^c UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0346002994     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/11/16/007     Document Type: Article

References (14)

1. Takahashi I, Hibino M and Kudo T 1996 Japan. J. Appl. Phys. 35 438
2. Morin F J 1959 Phys. Rev. Lett. 3 34
3. Verleur H V, Barker A S and Berglund C N 1968 Phys. Rev. 172 788
4. Goodenough J B 1971 J. Solid State Chem. 3 490
5. Rice T M, Launois H and Pouget J P 1994 Phys. Rev. Lett. 73 3042
6. Kusano E and Theil J A 1989 J. Vac. Sci. Technol. A 7 1314
7. Potember R S and Speck K R 1990 Proc. SPIE (Sol-Gel Opt.) 1328 364
8. Theil J A, Kusano E and Rockett A 1997 Thin Solid Films 298 122
9. Jin P and Tanemura S 1994 Japan. J. Appl. Phys. 33 1478
10. Kawakubo T and Nagakawa T 1964 J. Phys. Soc. Japan 19 517
11. Reyes J M, Lynch G F, Sayer M, McBride S L and Hutchinson T S 1972 J. Can. Ceram. Soc. 41 69
12. Kim D H and Kwok H S 1994 Appl. Phys. Lett. 65 3188
13. Haidinger W and Gross D 1972 Thin Solid Films 12 433
14. Beteille F 1997 Thesis Pierre and Marie Curie University, Paris