Measurements of the surface ionization in multilayered specimens

X-Ray Spectrometry

Volumn 33, Issue 5, 2004, Pages 376-386

  Merlet, C ^a   Llovet, X ^b   Salvat, F ^b  

^a UNIV MONTPELLIER   (France)

^b UNIVERSITY OF BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

INTELLIGENT SYSTEMS; IONIZATION; MULTILAYERS;

CHARACTERISTIC X RAYS; DIFFERENT THICKNESS; MEASUREMENTS OF; MONTE CARLO'S SIMULATION; MULTI-LAYERED; SINGLE ELEMENT; SURFACE-IONIZATION; TRACER METHODS; ULTRA-THIN; X RAY INTENSITY;

MONTE CARLO METHODS;

EID: 4544288043     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.757     Document Type: Article

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