Correlation between the atomic structures and the misorientation angles of [0001]-tilt grain boundaries at triple junctions in ZnO thin films grown on Si substrates

Applied Physics Letters

Volumn 89, Issue 10, 2006, Pages

  Shin, J W ^a   Lee, J Y ^a   No, Y S ^b   Kim, T W ^b   Choi, W K ^c  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Hanyang University   (South Korea)

^c Korea Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION THEORY; FILM GROWTH; GRAIN BOUNDARIES; MEASUREMENT THEORY; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDE;

ASYMMETRIC GRAIN BOUNDARIES; ATOMIC STRUCTURES; TRIPLE JUNCTIONS;

THIN FILMS;

EID: 33748500249     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2338792     Document Type: Article

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