Characterization of scaled SONOS EEPROM memory devices for space and military systems

Proceedings 2004 Non-Volatile Memory Technology Symposium, NVMTS 2004

Volumn , Issue , 2004, Pages 51-59

  White, Marvin H ^a   Adams, Dennis A ^b   Murray, James R ^c   Wrazien, Stephen ^a   Zhao, Yijie ^a   Wang, Yu ^a   Khan, Bilal ^a   Miller, Wayne ^a   Mehrotra, Rajiv ^a  

^a LEHIGH UNIVERSITY   (United States)

^b NORTHROP GRUMMAN CORPORATION   (United States)

^c SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EEPROM; MILITARY SYSTEMS; SILION-OXIDE-NITRIDE-OXIDE-SILICON (SONOS); THERMAL EXCITATION;

COMPUTER SIMULATION; COMPUTER TERMINALS; DIELECTRIC MATERIALS; MILITARY APPLICATIONS; ROM; SEMICONDUCTOR DEVICES; TEMPERATURE MEASUREMENT;

DATA STORAGE EQUIPMENT;

EID: 18844377654     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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