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Volumn 90, Issue 18-19, 2006, Pages 3449-3455
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The diffusion of hydrogen and inert gas in sputtered a-SiC:H alloys: Microstructure study
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Author keywords
Amorphous films; Hydrogen effusion; SIMS; Sputtering
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Indexed keywords
AMORPHOUS FILMS;
ARGON;
DIFFUSION;
HYDROGEN;
INERT GASES;
MICROSTRUCTURE;
SECONDARY ION MASS SPECTROMETRY;
SPUTTERING;
HYDROGEN EFFUSION;
IMPLANTED INERT GASES;
SILICON CARBIDE;
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EID: 33748463605
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.solmat.2006.04.013 Document Type: Article |
Times cited : (3)
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References (16)
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