Variation of output properties of perylene field-effect transistors by work function of source/drain electrodes

Applied Physics Letters

Volumn 89, Issue 5, 2006, Pages

  Ohta, Toshio ^b   Nagano, Takayuki ^b   Ochi, Kenji ^b   Kubozono, Yoshihiro ^a   Shikoh, Eiji ^c   Fujiwara, Akihiko ^c  

^a OKAYAMA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; ELECTRODES; ELECTRON MOBILITY; POLYCYCLIC AROMATIC HYDROCARBONS; STRONTIUM COMPOUNDS; THIN FILMS;

ENERGY BARRIERS; FIELD-EFFECT MOBILITY; METAL ELECTRODES; N-CHANNEL CONDUCTION;

FIELD EFFECT TRANSISTORS;

EID: 33748460527     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2266596     Document Type: Article

References (15)

1. C. D. Dimitrakopoulos and D. J. Mascaro, IBM J. Res. Dev. 45, 11 (2001).
2. C. D. Dimitrakopoulos and P. R. L. Malenfant, Adv. Mater. (Weinheim, Ger.) 14, 99 (2002).
3. R. C. Haddon, A. S. Perel, R. C. Morris, T. T. M. Palstra, A. F. Hebard, and R. M. Fleming, Appl. Phys. Lett. 67, 121 (1995).
4. S. Kobayashi, T. Takenobu, S. Mori, A. Fujiwara, and Y. Iwasa, Appl. Phys. Lett. 82, 4581 (2003).
5. Y.-Y. Lin, D. J. Gundlach, S. F. Nelson, and T. N. Jackson, IEEE Electron Device Lett. 18, 606 (1997).
6. T. Yasuda, T. Goto, K. Fujita, and T. Tsutsui, Appl. Phys. Lett. 85, 2098 (2004).
7. H. B. Michaelson, J. Appl. Phys. 48, 4729 (1977).
8. N. Saito, Y. Saito, and H. Shinohara, Chem. Phys. 162, 433 (1992).
9. T. Nishikawa, S. Kobayashi, T. Nakanowatari, T. Mitani, T. Shimoda, Y. Kubozono, G. Yamamoto, H. Ishii, M. Niwano, and Y. Iwasa, J. Appl. Phys. 97, 104509 (2005).
10. T. Kanbara, K. Shibata, S. Fujiki, Y. Kubozono, S. Kashino, T. Urisu, M. Sakai, A. Fujiwara, R. Kumashiro, and K. Iknigaki, Chem. Phys. Lett. 379, 223 (2003).
11. T. Ohta, T. Nagano, K. Ochi, Y. Kubozono, and A. Fujiwara, Appl. Phys. Lett. 88, 103506 (2006).
12. S. M. Sze, Semiconductor Devices: Physics and Technology (Wiley, New York, 2002), p. 186.
13. N. Sato, G. Saito, and H. Inokuchi, Chem. Phys. 76, 79 (1983).
14. K. Seki, Mol. Cryst. Liq. Cryst. 171, 255 (1989).
15. T. M. Halasinski, J. L. Weisman, R. Ruiterkamp, T. J. Lee, F. Salama, and M. Head-Gordon, J. Phys. Chem. A 107, 3660 (2003).