A translinear-based RF RMS detector for embedded test

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 1, Issue , 2004, Pages

  Yin, Qizhang ^a   Eisenstadt, William R ^a   Fox, Robert M ^a  

^a University of Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EMBEDDED TESTS; RMS DETECTORS; VOLTAGE PROCESSING;

BANDWIDTH; DIFFERENTIAL EQUATIONS; ELECTRIC POWER MEASUREMENT; ERROR ANALYSIS; LOW PASS FILTERS; MICROPROCESSOR CHIPS; OPERATIONAL AMPLIFIERS; SIGNAL PROCESSING;

CMOS INTEGRATED CIRCUITS;

EID: 4344596873     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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