Broadband space conservative on-wafer network analyzer calibrations with more complex load and thru models

IEEE Transactions on Microwave Theory and Techniques

Volumn 54, Issue 9, 2006, Pages 3583-3592

  Padmanabhan, Sathya ^a,b,c   Dunleavy, Lawrence ^a,b   Daniel, John E ^a,b,d   Rodríguez, Alberto ^a,b   Kirby, Peter L ^a,e  

^a IEEE   (United States)

^b University of South Florida   (United States)

^c Semflex Inc   (United States)

^d Insyte Corporation   (United States)

^e GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Calibration; Error correction; Millimeter wave measurements; Scattering parameters; Standards

Indexed keywords

FILMWARES; MICROSTRIP STANDARDS; MILLIMETER-WAVE MEASUREMENTS; VECTOR NETWORK ANALYZER (VNA) CALIBRATION;

CALIBRATION; CIRCULAR WAVEGUIDES; ELECTRIC LOADS; ERROR CORRECTION; LARGE SCALE SYSTEMS; MATHEMATICAL MODELS; MICROSTRIP LINES; NATURAL FREQUENCIES; SCATTERING PARAMETERS; STANDARDS; THIN FILMS;

ELECTRIC NETWORK ANALYSIS;

EID: 33748359113     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2006.881027     Document Type: Article

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