The effect of load variations on on-wafer lumped element based calibrations

54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999

Volumn , Issue , 1999, Pages

  Kirby, Pete ^a   Dunleavy, Lawrence ^a   Weller, Thomas ^a  

^a UNIVERSITY OF SOUTH FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC COMPOUNDS; GALLIUM ARSENIDE; GALLIUM COMPOUNDS; MICROWAVE MEASUREMENT;

CALIBRATION ERROR; CALIBRATION STANDARD; DC RESISTANCE; GAAS SUBSTRATES; LOAD VARIATIONS; LUMPED ELEMENT; MEASUREMENT-BASED; ON-WAFER CALIBRATION;

CALIBRATION;

EID: 84860521630     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1999.327368     Document Type: Conference Paper

References (6)

1. G. F. Engen and C. A. Hoer, "Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer," IEEE Trans. on Microwave Theor. Tech., vol. 27, pp. 987-993, Dec. 1979.
2. R. B. Marks, "A Multiline Method of Network Analyzer Calibration," IEEE Trans. on Microwave Theor. Tech., vol. 39 No. 7, July 1991.
3. S. Lautzenhiser, A. Davidson, and K. Jones, "Improve Accuracy of On-Wafer Tests Via LRM Calibration," Microwaves & RF, vol. 29 No. 1, pp. 105-109, Jan. 1990.
4. M. Imparato, T. Weller and L. Dunleavy, "On-Wafer Calibration Using Space-Conservative (SOLT) Standards", 1999 IEEE MTT-S Int. Microwave Symposium Digest June 1999.
5. R. Marks, and D. Williams, "Characteristic Impedance Determination Using Propagation Constant Measurement," IEEE Microwave and Guided Wave Letters, Vol. 1, No. 6, pp141-143, June 1991.
6. D. F. Williams, R. B. Marks, and A. Davidson, "Comparison of On-Wafer Calibrations," 38th ARFTG Conference Digest, pp. 68-81, Dec. 1991.