Accurate broadband on-wafer SOLT calibrations with complex load and thru models

61st ARFTG Conference Digest Spring 2003: Measurement Accuracy, ARFTG Spring 2003

Volumn , Issue , 2003, Pages 5-10

  Padmanabhan, Sathya ^a   Kirby, Peter ^b   Daniel, John ^a   Dunleavy, Lawrence ^a  

^a University of South Florida   (United States)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX NETWORKS; FIRMWARE; GALLIUM ARSENIDE; III-V SEMICONDUCTORS; SEMICONDUCTING GALLIUM;

COMPLEX LOADS; EXPERIMENTAL VERIFICATION; HIGH FREQUENCY HF; LOAD MODELING; LOW-FREQUENCY; RF PERFORMANCE; SHORT-OPEN-LOAD-THRU; VECTOR NETWORK ANALYZERS;

ELECTRIC NETWORK ANALYZERS;

EID: 84954205154     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTGS.2003.1216861     Document Type: Conference Paper

References (13)

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