On-wafer calibration using space-conservation (SOLT) standards

IEEE MTT-S International Microwave Symposium Digest

Volumn 4, Issue , 1999, Pages 1643-1646

  Imparato, M ^a   Weller, T ^a   Dunleavy, L ^a  

^a UNIVERSITY OF SOUTH FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ELECTRIC NETWORK PARAMETERS; MATHEMATICAL MODELS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; SEMICONDUCTING GALLIUM ARSENIDE; STANDARDS; WAVEGUIDES;

ON WAFER CALIBRATION; S-PARAMETERS; SHORT OPEN LOAD THRU STANDARD;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 0033359893     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)