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Volumn 118, Issue 1-2, 2006, Pages 110-114

Gas sensing properties of SnO2 thin films grown by MBE

Author keywords

Molecular beam epitaxy; Tin dioxide

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; HALL EFFECT; HIGH ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; POLYCRYSTALLINE MATERIALS; SAPPHIRE; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 33748338340     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2006.04.006     Document Type: Article
Times cited : (20)

References (12)
  • 4
    • 33748674484 scopus 로고    scopus 로고
    • P. Romppainen, V. Lantto, Rep. S93, Department of Electrical Engineering, University of Oulu, Finland, 1987, p. 22.
  • 11
    • 0003427458 scopus 로고
    • Addison-Wesley Publishing Co., Reading, Massachusetts
    • Cullity D. Elements of X-ray Diffraction (1978), Addison-Wesley Publishing Co., Reading, Massachusetts
    • (1978) Elements of X-ray Diffraction
    • Cullity, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.