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Volumn 119, Issue 1, 2006, Pages 47-51

Comprehensive study of pseudomorphic high electron mobility transistor (pHEMT)-based hydrogen sensor

Author keywords

AlGaAs; Hydrogen sensor; Off state breakdown; pHEMT

Indexed keywords

BAND STRUCTURE; BANDWIDTH; CURRENT DENSITY; ELECTRIC CURRENTS; INTEGRATED CIRCUIT LAYOUT; SCHOTTKY BARRIER DIODES; THRESHOLD VOLTAGE; TRANSISTORS;

EID: 33748305638     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2005.11.049     Document Type: Article
Times cited : (14)

References (16)
  • 6
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    • Pd-on-GaAs Schottky contact: its barrier height and response to hydrogen
    • Nie H.Y., and Mammichi Y. Pd-on-GaAs Schottky contact: its barrier height and response to hydrogen. Jpn. J. Appl. Phys. 30 (1991) 906-913
    • (1991) Jpn. J. Appl. Phys. , vol.30 , pp. 906-913
    • Nie, H.Y.1    Mammichi, Y.2
  • 7
    • 0027647550 scopus 로고
    • Gas sensors for high temperature operation based on metal oxide silicon carbide (MOSiC) devices
    • Arbab A., Spetz A., and Lundström I. Gas sensors for high temperature operation based on metal oxide silicon carbide (MOSiC) devices. Sens. Actuators B 15-16 (1993) 19-23
    • (1993) Sens. Actuators B , vol.15-16 , pp. 19-23
    • Arbab, A.1    Spetz, A.2    Lundström, I.3
  • 8
    • 0032632726 scopus 로고    scopus 로고
    • High temperature Pt Schottky diode gas sensors on n-type GaN
    • Luther B.P., Wolter A.D., and Mohney S.E. High temperature Pt Schottky diode gas sensors on n-type GaN. Sens. Actuators B 56 (1999) 164-168
    • (1999) Sens. Actuators B , vol.56 , pp. 164-168
    • Luther, B.P.1    Wolter, A.D.2    Mohney, S.E.3
  • 14
    • 0942300079 scopus 로고    scopus 로고
    • Comparative hydrogen sensing performances of Pd- and Pt-InGaP metal-oxide-semiconductor Schottky diodes
    • Tsai Y.Y., Lin K.W., Chen H.I., Lu C.T., Chuang H.M., Chen C.Y., and Liu W.C. Comparative hydrogen sensing performances of Pd- and Pt-InGaP metal-oxide-semiconductor Schottky diodes. J. Vac. Sci. Tech. B21 (2003) 2471-2477
    • (2003) J. Vac. Sci. Tech. , vol.B21 , pp. 2471-2477
    • Tsai, Y.Y.1    Lin, K.W.2    Chen, H.I.3    Lu, C.T.4    Chuang, H.M.5    Chen, C.Y.6    Liu, W.C.7
  • 15
    • 0027649811 scopus 로고
    • A new drain-current injection technique for the measurement of off-state breakdown voltage in FETs
    • Bahl S.R., and Alamo J.A.D. A new drain-current injection technique for the measurement of off-state breakdown voltage in FETs. IEEE Trans. Electron Devices 40 (1993) 1558-1560
    • (1993) IEEE Trans. Electron Devices , vol.40 , pp. 1558-1560
    • Bahl, S.R.1    Alamo, J.A.D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.