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Volumn 89, Issue 9, 2006, Pages

Residual stress minimum in nanocrystalline diamond films

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; CHEMICAL VAPOR DEPOSITION; DEPOSITION; DIAMONDS; GRAIN BOUNDARIES; OPTIMIZATION; RESIDUAL STRESSES; SILICON NITRIDE; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 33748255714     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2339042     Document Type: Article
Times cited : (26)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.