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Volumn 46, Issue 9-11, 2006, Pages 1886-1891

Improved physical understanding of intermittent failure in continuous monitoring method

Author keywords

[No Author keywords available]

Indexed keywords

CONDITION MONITORING; CRACK PROPAGATION; ELECTRIC RESISTANCE; ELECTRONIC PROPERTIES; EQUIPMENT TESTING; PRODUCT LIABILITY; RELIABILITY; SAMPLING; SOLDERED JOINTS;

EID: 33747774137     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2006.07.086     Document Type: Article
Times cited : (12)

References (9)
  • 1
    • 33747794713 scopus 로고    scopus 로고
    • IPC-SM-785 - Guidelines for Accelerated Rel. Testing of Surface Mount Solder Attachments. IPC. Nov. 1992.
  • 2
    • 33747803193 scopus 로고    scopus 로고
    • Brizoux M, et al. Continuous Monitoring Test. Design for Reliability in a Lead-Free world. NPL, Teddington, UK. January 2002.
  • 3
    • 33747749640 scopus 로고    scopus 로고
    • Dunwoody S, Bock E, Sophia J. A Practical and Reliable Method for Detection of Nanosecond Intermittency. 20th Annual Connector and Interconnection Symposium, San Jose, USA. 1995.
  • 4
    • 33747772177 scopus 로고    scopus 로고
    • Detecting Interconnect Failures
    • Engelmaier W. Detecting Interconnect Failures. Global SMT & Packaging 3 1 (2003)
    • (2003) Global SMT & Packaging , vol.3 , Issue.1
    • Engelmaier, W.1
  • 5
    • 0036890557 scopus 로고    scopus 로고
    • Failure criteria of flip chip joints during accelerated testing
    • Stepniak F. Failure criteria of flip chip joints during accelerated testing. Microelectronics Reliability 42 (2002) 1921-1930
    • (2002) Microelectronics Reliability , vol.42 , pp. 1921-1930
    • Stepniak, F.1
  • 6
    • 33747778500 scopus 로고    scopus 로고
    • Bartelo J. Thermomechanical Fatigue Behavior of Selected LF Solders. IPC APEX 2001.
  • 7
    • 4444380026 scopus 로고    scopus 로고
    • Suhling JC, et al. Thermal Cycling Reliability of Lead Free Solders for Automotive Application. 2004 Ubter Society Conference on Thermal Phenomena. 2004;350-357.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.