Synthesis and characterization of type-II textured tungsten disulfide thin films by vdWR process with Pb interfacial layer as texture promoter

Journal of Crystal Growth

Volumn 290, Issue 2, 2006, Pages 363-368

  Sadale, S B ^a   Patil, P S ^a  

^a SHIVAJI UNIVERSITY   (India)

Author keywords

A1. Characterization; A1. Sulfurization; A3. van der Waals rheotaxy process; B1. Sulfides; B1. Transition metal dichalcogenides; B2. Semiconducting materials

Indexed keywords

ENERGY DISPERSIVE SPECTROSCOPY; LEAD; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SYNTHESIS (CHEMICAL); THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

SULFIDES; SULFURIZATION; TRANSITION METAL DICHALCOGENIDES; VAN DER WAALS RHEOTAXY PROCESS (VDWR);

TUNGSTEN COMPOUNDS;

EID: 33747770357     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.01.057     Document Type: Article

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