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Volumn 81-82, Issue , 1999, Pages 306-311

XPS analysis of the lithium intercalation in amorphous tungsten oxysulfide thin films

Author keywords

Lithium batteries; RF magnetron sputtering; Thin films; Transition element oxysulfide; XPS analysis

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTROCHEMISTRY; INTERCALATION COMPOUNDS; LITHIUM BATTERIES; MAGNETRON SPUTTERING; POLYCRYSTALLINE MATERIALS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TUNGSTEN COMPOUNDS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0033185267     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0378-7753(99)00129-9     Document Type: Article
Times cited : (34)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.