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Volumn 81-82, Issue , 1999, Pages 306-311
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XPS analysis of the lithium intercalation in amorphous tungsten oxysulfide thin films
a a a b b |
Author keywords
Lithium batteries; RF magnetron sputtering; Thin films; Transition element oxysulfide; XPS analysis
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Indexed keywords
ELECTRIC CONDUCTIVITY OF SOLIDS;
ELECTROCHEMISTRY;
INTERCALATION COMPOUNDS;
LITHIUM BATTERIES;
MAGNETRON SPUTTERING;
POLYCRYSTALLINE MATERIALS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
THIN FILMS;
TUNGSTEN COMPOUNDS;
X RAY DIFFRACTION ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
LITHIUM INTERCALATION;
TUNGSTEN OXYSULFIDE;
LITHIUM COMPOUNDS;
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EID: 0033185267
PISSN: 03787753
EISSN: None
Source Type: Journal
DOI: 10.1016/S0378-7753(99)00129-9 Document Type: Article |
Times cited : (34)
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References (16)
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