Analysis of SiOxCyHz polymeric materials by x-ray absorption spectroscopy: Anomalous behavior of the resonant Si KLL Auger spectra

Journal of Applied Physics

Volumn 100, Issue 3, 2006, Pages

  Barranco, A ^a   Yanguas Gil, A ^a   Yubero, F ^a   Gonzalez Elipe A R ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; AUGER ELECTRON SPECTROSCOPY; CHEMICAL BONDS; DISPERSIONS; ELECTRONIC STRUCTURE; KINETIC ENERGY; PHOTONS; POLYMERS; SPECTRUM ANALYSIS; THIN FILMS; X RAY ANALYSIS;

AUGER SIGNAL; PHOTON ENERGY; POLYMERIC THIN FILM; X-RAY ABSORPTION SPECTROSCOPY;

SILICON COMPOUNDS;

EID: 33747499556     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2222043     Document Type: Article

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