Electronic structures of ultra-thin silicon carbides deposited on graphite

Applied Surface Science

Volumn 234, Issue 1-4, 2004, Pages 246-250

  Baba, Y ^a   Sekiguchi, T ^a   Shimoyama, I ^a   Nath, Krishna G ^a  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; BINDING ENERGY; ELECTRONIC STRUCTURE; GRAPHITE; GROWTH (MATERIALS); MONOLAYERS; OPTOELECTRONIC DEVICES; POLARIZATION; PYROLYSIS; SEMICONDUCTOR MATERIALS; ULTRATHIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

FLAT-FLYING STRUCTURE; HIGHLY ORIENTED PYROLYTIC GRAPHITE (HOPG); POLARIZATION DEPENDENCIES; X-RAY ABSORPTION NEAR EDGE STRUCTURE (XANES);

SILICON CARBIDE;

EID: 3343016666     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.05.045     Document Type: Conference Paper

References (20)

1. Münch W.V., Hoeck P. Solid State Electron. 21:1978;479.
2. Bhatnagar M., Baliga B.J. IEEE Trans. Electron Devices. 40:1993;645.
3. Heya A., Masuda A., Matsumura H. Appl. Phys. Lett. 74:1999;2143.
4. Wakita K., Tokitoh N., Okazaki R., Takagi N., Nagase S. J. Am. Chem. Soc. 122:2000;5648.
5. Solomon I. Appl. Surf. Sci. 1847:2001;3.
6. Fuentes-Cabrera M., Munoz A., Windl W., Demkov A.A., Sankey O.F. Model. Simul. Mater. Sci. Eng. 7:1999;929.
7. Baba Y., Sekiguchi T., Shimoyama I. Nucl. Instrum. Meth. Phys. Res. B. 194:2002;41.
8. Johansson L.I., Virojanadara C., Eickhoff Th., Drube W. Surf. Sci. 529:2003;515.
9. Umesaki N., Guy C., Kamijo N., Okamura K., Suzuya K., Suzuki K. J. Non-Cryst. Sol. 177:1994;147.
10. Chang Y.K., Hsieh H.H., Pong W.F., Tsai M.H., Dann T.E., Chien F.Z., Tseng P.K., Chen L.C., Wei S.L., Chen K.H., Wu J.J., Chen Y.F. J. Appl. Phys. 86:1999;5609.
11. Comelli G., Stohr J., Robinson C.J., Jark W. Phys. Rev. B. 38:1988;7511.
12. Küper G., Chauvistre R., Hormes J., Frick F., Jansen M., Lüer B., Hartmann E. Chem. Phys. 165:1992;405.
13. Okude N., Nagoshi M., Noro H., Baba Y., Yamamoto H., Sasaki T.A. J. Electron Spectrosc. Relat. Phenom. 101-103:1999;607.
14. Sasaki T.A., Baba Y., Yoshii K., Yamamoto H. J. Electron Spectrosc. Relat. Phenom. 76:1995;411.
15. Yoshii K., Baba Y., Sasaki T.A. J. Electron Spectrosc. Relat. Phenom. 79:1996;215.
16. Y. Mochizuki, private communication.
17. J. Stöhr, in: G. Ertl, R. Gomer, D.L. Mills, H.K.V. Lotsch (Eds.), NEXAFS Spectroscopy, Springer-Verlag, 1991, p. 71.
18. J. Stöhr, in: G. Ertl, R. Gomer, D.L. Mills, H.K.V. Lotsch (Eds.), NEXAFS Spectroscopy, Springer-Verlag, 1991, p. 203.
19. Rosenberg R.A., Love P.J., Rehn V. Phys. Rev. B. 33:1986;4034.
20. Y. Baba, T. Sekiguchi, I. Shimoyama, K.G. Nath, unpublished results.