Complementary thermoreflectance and micro-Raman analysis of facet temperatures of diode lasers

Applied Physics Letters

Volumn 89, Issue 7, 2006, Pages

  Ochalski, Tomasz J ^a   Pierścińska, Dorota ^a   Pierściński, Kamil ^a   Bugajski, Maciej ^a   Tomm, Jens W ^b   Grunske, Tobias ^b   Kozlowska, Anna ^a  

^a ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

^b MAX BORN INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONFORMAL MAPPING; DATA ACQUISITION; LASERS; LIGHT REFLECTION; RAMAN SPECTROSCOPY; THERMAL EFFECTS;

LASER STRUCTURES; MICRO-RAMAN ANALYSIS; THERMOREFLECTANCE;

SEMICONDUCTOR LASERS;

EID: 33747494887     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2335675     Document Type: Article

References (12)

1. http://www.jold.com/
2. A. Knigge, G. Erbert, J. Jönsson, R. Staske, B. Sumpf, M. Weyers, and G. Tränkte, Proceedings of the Conference on Lasers and Electro-Optics Europe, Munich, Germany [Europhys. Conf. Abstr. 29B, (2005)].
3. S. Todoroki, M. Sawai, and K. Aiki, J. Appl. Phys. 58, 1124 (1985).
4. H. Bragger and P. W. Epperlein, Appl. Phys. Lett. 56, 1049 (1990).
5. W. C. Tang, H. H. Rosen, P. Vettinger, and D. J. Webb, Appl. Phys. Lett. 58, 557 (1991).
6. P. W. Eppertein, G. L. Bona, and P. Roentgen, Appl. Phys. Lett. 60, 680 (1992).
7. D. Wawer, T. J. Ochalski, T. Piwoński, A. Wójcik- Jedlińska, M. Bugajski, and H. Page, Phys. Status Solidi A 202, 1227 (2005).
8. A. Malag, Bull. Pol. Acad. Sci.: Tech. Sci. 53, 167 (2005).
9. J. W. Tomm, E. Thamm, A. Barwolff, T. Elsaesser, J. Luft, M. Baeumler, S. Mueller, W. Jantz, I. Rechenberg, and G. Erbert, Appl. Phys. A: Mater. Sci. Process. 70, 377 (2000).
10. E. Matatagui, A. G. Thompson, and Manuel Cardona, Phys. Rev. 176, 950 (1968).
11. G. Tessier, S. Hole, and D. Fournier, Appl. Phys. Lett. 78, 2267 (2001).
12. D. E. Aspnes, S. M. Kelso, R. A. Logan, and R. Bhat, J. Appl. Phys. 60, 754 (1986).