메뉴 건너뛰기




Volumn 6261 I, Issue , 2006, Pages

Dynamics of particle ejection in dry laser cleaning

Author keywords

Forward scattering detection; Laser cleaning; Particle ejection; Particle removal

Indexed keywords

IRRADIATION; LASER APPLICATIONS; LASER PULSES; NANOTECHNOLOGY; SCATTERING; SILICON;

EID: 33747339214     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.674578     Document Type: Conference Paper
Times cited : (2)

References (17)
  • 1
    • 4344679284 scopus 로고    scopus 로고
    • Particle on surface: 3d-effects in dry laser cleaning
    • B. Luk'yanchuk, Z. Wang, W. Song, and M. Hong, "Particle on surface: 3d-effects in dry laser cleaning," Appl. Phys. A 79, pp. 747-751, 2004.
    • (2004) Appl. Phys. A , vol.79 , pp. 747-751
    • Luk'yanchuk, B.1    Wang, Z.2    Song, W.3    Hong, M.4
  • 2
    • 33746826010 scopus 로고    scopus 로고
    • Theoretical description of dry laser cleaning
    • N. Arnold, "Theoretical description of dry laser cleaning," Appl. Surf. Sci. 15(22), pp. 208-209, 2003.
    • (2003) Appl. Surf. Sci. , vol.15 , Issue.22 , pp. 208-209
    • Arnold, N.1
  • 3
    • 0001248896 scopus 로고
    • Efficient pulsed laser removal of 0.2 um sized particles from solid surface
    • W. Zapka, W. Ziemlich, and A. Tam, "Efficient pulsed laser removal of 0.2 um sized particles from solid surface," Appl. Phys. Lett. 58(20), pp. 2217-2219, 1991.
    • (1991) Appl. Phys. Lett. , vol.58 , Issue.20 , pp. 2217-2219
    • Zapka, W.1    Ziemlich, W.2    Tam, A.3
  • 4
    • 0034206767 scopus 로고    scopus 로고
    • Universal threshold for the steam laser cleaning of submicron spherical particles from silicon
    • M. Mosbacher, V. Dobler, J. Boneberg, and P. Leiderer, "Universal threshold for the steam laser cleaning of submicron spherical particles from silicon," Appl. Phys. A 70, pp. 669-672, 2000.
    • (2000) Appl. Phys. A , vol.70 , pp. 669-672
    • Mosbacher, M.1    Dobler, V.2    Boneberg, J.3    Leiderer, P.4
  • 5
    • 0036477495 scopus 로고    scopus 로고
    • Krf excimer laser dry and steam cleaning of silicon surfaces with metallic particulate contaminants
    • P. Neves, M. Arronte, and R. V. ans A.M. Bothelo do Rego, "Krf excimer laser dry and steam cleaning of silicon surfaces with metallic particulate contaminants," Appl. Phys. A 74, pp. 191-199, 2002.
    • (2002) Appl. Phys. A , vol.74 , pp. 191-199
    • Neves, P.1    Arronte, M.2    Bothelo Do Rego, R.V.A.A.M.3
  • 6
    • 0037287311 scopus 로고    scopus 로고
    • Nanoparticle removal from trenches and pinholes with pulsed-laser induced plasma and shock waves
    • R. Vanderwood and C. Cetinkaya, "Nanoparticle removal from trenches and pinholes with pulsed-laser induced plasma and shock waves," J. Adh. Sci. Tech. 17(1), 2003.
    • (2003) J. Adh. Sci. Tech. , vol.17 , Issue.1
    • Vanderwood, R.1    Cetinkaya, C.2
  • 8
    • 4344626921 scopus 로고    scopus 로고
    • Ablative thresholds in laser cleaning of substrates from participates
    • N. Arnold, G. Serems, and D. Bauerle, "Ablative thresholds in laser cleaning of substrates from participates," Appl. Phys. A 79, pp. 729-734, 2004.
    • (2004) Appl. Phys. A , vol.79 , pp. 729-734
    • Arnold, N.1    Serems, G.2    Bauerle, D.3
  • 9
    • 0344771168 scopus 로고    scopus 로고
    • Laser-assisted removal of particles on silicon wafers
    • G. Vereecke, E. Rohr, and M. Heyns, "Laser-assisted removal of particles on silicon wafers," J. Appl. Phys. 85(7), p. 3837, 1999.
    • (1999) J. Appl. Phys. , vol.85 , Issue.7 , pp. 3837
    • Vereecke, G.1    Rohr, E.2    Heyns, M.3
  • 11
    • 0040622216 scopus 로고    scopus 로고
    • Dry laser cleaning of particles from solid substrates: Experiments and theory
    • Y. Zheng, B. Luk'yanchuk, Y. Lu, W. Song, and Z. Mai, "Dry laser cleaning of particles from solid substrates: Experiments and theory," J. Appl. Phys. 90(5), pp. 2135-2142, 2001.
    • (2001) J. Appl. Phys. , vol.90 , Issue.5 , pp. 2135-2142
    • Zheng, Y.1    Luk'yanchuk, B.2    Lu, Y.3    Song, W.4    Mai, Z.5
  • 15
    • 30744451156 scopus 로고    scopus 로고
    • Direct femtosecond laser nanopatterning of glass substrate by particle-assisted near-fied enhancement
    • 023110
    • Y. Zhou, M. Hong, J. Fuh, L. Lu, B. Luk'yanchuck, Z. Wang, L. Shi, and T. Chong, "Direct femtosecond laser nanopatterning of glass substrate by particle-assisted near-fied enhancement," Appl. Phy. Lett. 88(023110), pp. 1-3, 2006.
    • (2006) Appl. Phy. Lett. , vol.88 , pp. 1-3
    • Zhou, Y.1    Hong, M.2    Fuh, J.3    Lu, L.4    Luk'yanchuck, B.5    Wang, Z.6    Shi, L.7    Chong, T.8
  • 17
    • 33646544070 scopus 로고    scopus 로고
    • Influence of laser pulse shape on dry laser cleaning
    • In press, available online
    • D. Grojo, M. Boyomo-Onana, A. Gros, and P. Delaporte, "Influence of laser pulse shape on dry laser cleaning," Appl. Surf. Sci. In press, available online, 2006.
    • (2006) Appl. Surf. Sci.
    • Grojo, D.1    Boyomo-Onana, M.2    Gros, A.3    Delaporte, P.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.