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Journal of Crystal Growth

Volumn 161, Issue 1-4, 1996, Pages 119-127

Native defect identification in II-VI materials

(2) Meyer, B K a Stadler, W a

a TECHNICAL UNIVERSITY OF MUNICH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; IMPURITIES; MOLECULAR BEAM EPITAXY; PARAMAGNETIC RESONANCE; PHOTOLUMINESCENCE; SEMICONDUCTING TELLURIUM COMPOUNDS; SEMICONDUCTING ZINC COMPOUNDS;

CADMIUM TELLURIDE; NATIVE DEFECT; POSITRON ANNIHILATION SPECTROSCOPY; ZINC TELLURIDE;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0030125312 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/0022-0248(95)00620-6 Document Type: Article

Times cited : (80)

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