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Volumn 46, Issue 9, 2006, Pages
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Fast automated analysis of high-resolution reflectometer density profiles on DIII-D
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
DEPOSITION;
ELECTROMAGNETIC WAVE POLARIZATION;
ELECTRON TRANSITIONS;
TOKAMAK DEVICES;
REFLECTOMETER DENSITY;
SPATIAL RESOLUTION;
SYSTEM DENSITY;
REFLECTOMETERS;
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EID: 33747236069
PISSN: 00295515
EISSN: 17414326
Source Type: Journal
DOI: 10.1088/0029-5515/46/9/S03 Document Type: Article |
Times cited : (39)
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References (24)
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