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Volumn 46, Issue 9, 2006, Pages

Fast automated analysis of high-resolution reflectometer density profiles on DIII-D

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; DEPOSITION; ELECTROMAGNETIC WAVE POLARIZATION; ELECTRON TRANSITIONS; TOKAMAK DEVICES;

EID: 33747236069     PISSN: 00295515     EISSN: 17414326     Source Type: Journal    
DOI: 10.1088/0029-5515/46/9/S03     Document Type: Article
Times cited : (39)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.