Improved reflectometer electron density profile measurements on DIII-D

Review of Scientific Instruments

Volumn 74, Issue 3 II, 2003, Pages 1525-1529

  Wang, G ^a   Zeng, L ^a   Doyle, E J ^a   Rhodes, T L ^a   Peebles, W A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; DATA REDUCTION; FREQUENCIES; MAGNETIC FIELD EFFECTS; PLASMAS; SIGNAL TO NOISE RATIO;

ELECTRON DENSITY PROFILE;

REFLECTOMETERS;

EID: 0037348249     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1527251     Document Type: Conference Paper

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