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Volumn 70, Issue 1 II, 1999, Pages 1060-1063

Automatic evaluation of plasma density profiles from microwave reflectometry on ASDEX upgrade based on the time-frequency distribution of the reflected signals

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001078104     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149520     Document Type: Article
Times cited : (18)

References (6)
  • 2
    • 0347211460 scopus 로고
    • B. Boashash, Parts I and II, Proc. IEEE 4, (1992).
    • (1992) Proc. IEEE , vol.4 , Issue.1-2 PART
    • Boashash, B.1
  • 6
    • 0345950036 scopus 로고    scopus 로고
    • unpublished
    • F. Silva et al. (unpublished).
    • Silva, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.