Application of fast reflectometer density profile measurements to investigate plasma instabilities in DIII-D

Review of Scientific Instruments

Volumn 74, Issue 3 II, 2003, Pages 1530-1533

  Zeng, L ^a   Doyle, E J ^a   Rhodes, T L ^a   Wang, G ^a   Peebles, W A ^a   Burrell, K H ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b GENERAL ATOMICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; FREQUENCIES; MAGNETOHYDRODYNAMICS; MICROWAVES; OSCILLATIONS; PLASMA STABILITY;

DENSITY PROFILE;

REFLECTOMETERS;

EID: 0037348236     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1527250     Document Type: Conference Paper

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