Determining the film thickness and probing the interface structure with characteristic scanning tunneling spectroscopy

Chinese Journal of Physics

Volumn 44, Issue 4, 2006, Pages 309-315

  Lu, S M ^a,b   Shih, H T ^a   Jiang, C L ^a   Su, W B ^a   Chang, C S ^a   Tsong, Tien T ^a  

^a INSTITUTE OF PHYSICS   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33747189552     PISSN: 05779073     EISSN: 05779073     Source Type: Journal    
DOI: None     Document Type: Article

References (17)

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17. This transmission resonance can be distinguished by tuning the energy level of the standing-wave state 2, which can done by adjusting the tunneling current. When its energy level is changed, its spectral intensity would be larger than that of the transmission, allowing us to identify both of them.