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Volumn 88, Issue 20, 2002, Pages 2068011-2068014
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Imaging subsurface reflection phase with quantized electrons
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ELECTRONS;
EPITAXIAL GROWTH;
IMAGING TECHNIQUES;
INTERFACES (MATERIALS);
NANOSTRUCTURED MATERIALS;
QUANTUM THEORY;
SCANNING TUNNELING MICROSCOPY;
QUANTIZED ELECTRONS;
SURFACE-TO-VOLUME RATIO;
SEMICONDUCTOR QUANTUM WELLS;
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EID: 0037141316
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevLett.88.206801 Document Type: Article |
Times cited : (64)
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References (18)
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