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Volumn 252, Issue 19, 2006, Pages 7221-7223
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Different optical conductivity enhancement (OCE) protocols to eliminate charging during ultra low energy SIMS profiling of semiconductor and semi-insulating materials
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Author keywords
Charge compensation; Semi insulators; Semiconductors; Ultra low energy SIMS
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Indexed keywords
INSULATING MATERIALS;
ION BEAMS;
ION BOMBARDMENT;
LASER BEAM EFFECTS;
LIGHT SOURCES;
SECONDARY ION MASS SPECTROMETRY;
CHARGE COMPENSATION;
ELECTRON HOLE PAIRS;
SEMI INSULATORS;
ULTRA LOW ENERGY SIMS;
SEMICONDUCTOR MATERIALS;
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EID: 33747170300
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2006.02.143 Document Type: Article |
Times cited : (10)
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References (15)
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