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Volumn 252, Issue 19, 2006, Pages 7221-7223

Different optical conductivity enhancement (OCE) protocols to eliminate charging during ultra low energy SIMS profiling of semiconductor and semi-insulating materials

Author keywords

Charge compensation; Semi insulators; Semiconductors; Ultra low energy SIMS

Indexed keywords

INSULATING MATERIALS; ION BEAMS; ION BOMBARDMENT; LASER BEAM EFFECTS; LIGHT SOURCES; SECONDARY ION MASS SPECTROMETRY;

EID: 33747170300     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.143     Document Type: Article
Times cited : (10)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.