Analysis of noise characteristics for the active pixels in CMOS image sensors for X-ray imaging

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 565, Issue 1, 2006, Pages 263-267

  Kim, Young Soo ^a   Cho, Gyuseong ^a   Bae, Jun Hyung ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

CMOS APS; CMOS sensor; Noise; Photosensor; Pixel detector; X ray imaging

Indexed keywords

CHARGE COUPLED DEVICES; CMOS INTEGRATED CIRCUITS; IMAGING TECHNIQUES; MOS DEVICES; SIGNAL TO NOISE RATIO; TRANSISTORS; X RAY ANALYSIS;

CMOS APS; CMOS SENSORS; ELECTRONIC NOISE; PHOTOSENSORS; PIXEL DETECTORS; X-RAY IMAGING;

IMAGE SENSORS;

EID: 33747160408     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.05.008     Document Type: Article

References (11)

1. Janesick J., et al. Opt. Eng. 26 8 (1987) 868
2. Yang D., Min H., Fowler B., El Gamal A., Beiley M., and Cham K. Proc. SPIE 2950 (1996) 8
3. Fossum E.R. IEEE Trans. Electron Devices ED-10 (1997) 1689
4. Fossum E.R. Nucl. Instr. and Meth. A 395 (1997) 291
5. Mendis S.K., Kemeny S.E., Gee R.C., Pain B., Staller C.O., Kim Q., and Fossum E.R. IEEE J. Solid-State Circuits 32 2 (1997) 187
6. Fowler B., El Gamal A., Yang D., and Tian H. Proc. SPIE 3301 (1998) 178
7. El Gamal A., Fowler B., Min H., and Liu X. Proc. SPIE 3301 (1998) 168
8. Bogaerts J., Dierickx B., and Van Hoof C. Proc. SPIE 4134 (2000) 105
9. Tian H., Fowler B., and El Gamal A. IEEE J. Solid-State Circuits 36 1 (2001) 92
10. Abdalla M.A., Fröjdh C., and Petersson C.S. Nucl. Instr. and Meth. A 466 (2001) 232
11. Large Area Digital X-ray Specific Imagers-a white paper on CMOS X-ray imaging technology, Rad-icon Imaging Corp.