FIB and TEM studies of interface structure in diamond-SiC composites

Journal of Materials Science

Volumn 41, Issue 14, 2006, Pages 4611-4616

  Park, Joon Seok ^a   Sinclair, Robert ^a   Rowcliffe, David ^b   Stern, Margaret ^c   Davidson, Howard ^d  

^a Stanford University   (United States)

^b Skeleton Technologies AG   (United States)

^c SUN MICROSYSTEMS   (United States)

^d Isothermal Systems Research   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE MATERIALS; CRYSTALLOGRAPHY; DIAMONDS; ELECTRON DIFFRACTION; INTERFACES (MATERIALS); ION BEAMS; MICROSTRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

COMPOSITE BULK MATERIALS; ELECTRON DIFFRACTION PATTERNS; FOCUSED ION BEAMS (FIB); INTERFACE STRUCTURE;

SILICON CARBIDE;

EID: 33747150832     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-006-0249-7     Document Type: Conference Paper

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