Surface imaging by an ion probe scanning

EPJ Applied Physics

Volumn 11, Issue 2, 2000, Pages 147-151

  Wang, K ^a   Garoche, P ^a   Dumoulin, L ^b  

^a UNIVERSITÉ PARIS SUD   (France)

^b 91405 Orsay Campus   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL DEVICES; ELECTRIC CURRENTS; GALLIUM; ION BEAMS; ION MICROSCOPES; LIQUID METALS; METALLIC FILMS; SCANNING; VACUUM TECHNOLOGY; WETTING;

DIGITAL SCANNING DEVICES; ION GUNS; ION PROBE SCANNING; SCANNING PROBE MICROSCOPES; SURFACE IMAGING;

IMAGING SYSTEMS;

EID: 0034238538     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:2000155     Document Type: Article

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