Thermal resistance of interfaces in AlN-diamond thin film composites

Journal of Applied Physics

Volumn 91, Issue 3, 2002, Pages 1224-1235

  Jagannadham, K ^a   Wang, Hsin ^b  

^a North Carolina State University   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALN; AMORPHOUS REGIONS; CRYSTALLINE QUALITY; EFFECTIVE THERMAL CONDUCTIVITY; EXPERIMENTAL MEASUREMENTS; INTERFACIAL THERMAL RESISTANCE; LAYERED STRUCTURES; PLANAR INTERFACE; SILICON SUBSTRATES; THERMAL BARRIER; THIN FILM COMPOSITES;

COMPOSITE FILMS; DIAMOND FILMS; MULTILAYERS; QUALITY CONTROL;

INTERFACES (MATERIALS);

EID: 0036469393     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1428103     Document Type: Article

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